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Bio
His activities have included the research of the degradation phenomena and reliability assessment of SiO2, SiON, high-k, and ferroelectric films, planar and multiple-gate FETs, circuits, and characterization of Ge/III–V and MIM devices. He is currently serving on the IEEE T. Electron Dev. Editorial Board.
Research Interests
Papers共 698 篇Author StatisticsCo-AuthorSimilar Experts
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NPJ 2D MATERIALS AND APPLICATIONSno. 1 (2024): 1-7
Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra,Chris Nigh,Ruben Purdy,Ben Kaczer, Dishant Sangani,Pieter Weckx,Philippe J. Roussel,
IEEE European Test Symposiumpp.1-7, (2024)
Y. Guo, R. Degraeve,Michiel Vandemaele,Pablo Saraza-Canflanca,Jacopo Franco,Ben Kaczer,Erik Bury, Ingrid Verbauwhede
IEEE International Reliability Physics Symposiumpp.1-7, (2024)
IEEE Electron Device Lettersno. 99 (2024): 1-1
IEEE Transactions on Electron Devicesno. 99 (2024): 1-7
Solid-State Electronicspp.108929, (2024)
NPJ 2D MATERIALS AND APPLICATIONSno. 1 (2024)
IEEE International Reliability Physics Symposiumpp.1-6, (2024)
SOLID-STATE ELECTRONICS (2024)
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