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Research Interests

Papers共 168 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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Gate Oxide Reliability: Upcoming Trends, Challenges, and Opportunities
B. Kaczer,R. Degraeve,J. Franco,T. Grasser,Ph J. Roussel,E. Bury,P. Weckx,A. Chasin,S. Tyaginov, M. Vanclemacle,A. Grill,B. O'Sullivan,J. Diaz Fortuny, P. Saraza Canflanca,M. Waltl, P. Rinaudo, Y. Zhao, E. Kao,R. Asanovski, E. Catapano, A. Beckers,A. Vici,B. Truijen,Y. Higashi,S. Clima,Y. Xiang,D. Sangani,L. Panarella,Q. Smets,T. Knobloch,D. Waldhoer, B. Van Troeye, Y. Guo,A. Kruv, K. Viswakarma,M. Gonzalez,D. Linten
2024 IEEE SILICON NANOELECTRONICS WORKSHOP, SNW 2024pp.3-4, (2024)
Cited0Views0EIWOSBibtex
0
0
High Performance Mm Wave AlN/GaN MISHEMTs on 200 Mm Si Substrate
S. Yadav,A. Alian,R. ElKashlan,B. J. O’Sullivan,A. Khaled, B. Kazemi,U. Peralagu, S. Banerjee,B. Parvais,N. Collaert
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Cited5Views0EIWOSBibtex
5
0
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Author Statistics

#Papers: 168

#Citation: 2540

H-Index: 23

G-Index: 44

Sociability: 7

Diversity: 3

Activity: 14

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  • 学生
  • 导师
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