基本信息
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Career Trajectory
Bio
Arnaud Regnier was born in France, in 1980. He received the Engineering degree from the University of Marseille, Marseille, France, in 2003, and is currently working toward the Ph.D. degree in numerical simulation of NVM cells at the Laboratoire de Matériaux et Microelectronique de Provence (L2MP), Marseille, France.
His research interests include the physics and modeling of semiconductor devices.
Research Interests
Papers共 43 篇Author StatisticsCo-AuthorSimilar Experts
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2024 IEEE 36TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, ICMTS 2024pp.1-5, (2024)
Radouane Habhab,Vincenzo Della Marca,Pascal Masson, Nadia Miridi,Clement Pribat,Simon Jeannot,Thibault Kempf,Marc Mantelli,Philippe Lorenzini, Jean-Marc Voisin,Arnaud Regnier,Stephan Niel,
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)pp.21-24, (2023)
Lucas Antunes Tambara,Pascal Masson,Julien Amouroux,Stéphane Monfray,Julien Dura,Frederic Gianesello, Julien Babic,Romain Debroucke,Loic Welter,Siddhartha Dhar, Bernadette Gros,Clement Charbuillet,
IEEE International Conference on Design, Test and Technology of Integrated Systemspp.1-4, (2023)
Siddhartha Dhar,Stephane Monfray,Frederic Gianesello,Franck Julien,Julien Dura,Charles-Alex Legrand,Julien Amouroux, Bernadette Gros,Loic Welter,Clement Charbuillet,Philippe Cathelin, Elodie Canderle,
2023 IEEE 23RD TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMSpp.38-40, (2023)
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)pp.1-4, (2022)
Microelectronics Reliability (2022): 114717
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)pp.97-100, (2022)
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Author Statistics
#Papers: 43
#Citation: 299
H-Index: 12
G-Index: 16
Sociability: 5
Diversity: 2
Activity: 7
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