Alina Schilling graduated from the University of Bucharest, Romania, in 1998, with a diploma on “Field effect transistors with Cooper phthalocyanine thin films.” In 1999, she received her master's degree on “The effect of electron irradiation on the electrical properties of thin polycrystalline CdS layers.” She worked during her Ph.D. program in the Max Planck Institute for Microstructure Physics, Halle, Germany. She received her Ph.D. degree from Martin Luther University, Halle, Germany, with a thesis entitled “Growth mechanism and structure of epitaxial perovskite thin films and superlattices.” For her first postdoctoral position, she moved in 2003 to the Physics Department of the University of Virginia, Charlottesville, VA, where she studied geometrically frustrated magnetic systems. During this time, she performed neutron scattering experiments at the Argonne National Laboratory, IL, at the National Institute of Standards and Technology, MA, and at the Los Alamos National Laboratory, NM. Presently, she has a postdoctoral position in the Physics Department of Queen's University Belfast, UK, on a project involving ferroelectric FIB-prepared single crystal nanocapacitors. Her area of expertise is in ferroelectric and magnetic materials; she is well acquainted with various experimental techniques (i.e., AFM, SEM, FIB, PLD, electrical measurements, XRD, and neutron scattering).