Alfio Russo - STMicroelectronics | 人才画像

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论文共 7 篇作者统计合作学者相似作者

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Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs

Patrick Fiorenza, Francesco Cordiano,Mario Santo Alessandrino,Alfio Russo,Edoardo Zanetti,Mario Saggio, C. Bongiorno,Filippo Giannazzo,Fabrizio Roccaforte

IRPSpp.1-4, (2023)

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Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability

Beatrice Carbone,Mario Santo Alessandrino,Alfio Russo, Elisa Vitanza,Filippo Giannazzo,Patrick Fiorenza,Fabrizio Roccaforte

IRPSpp.1-5, (2023)

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Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer

Mario Santo Alessandrino,Beatrice Carbone, Francesco Cordiano, Bruna Mazza,Alfio Russo, W. Coco, Massimo Boscaglia,A. Di Salvo,A. Lombardo, D. Scarcella, Elisa Vitanza,Patrick Fiorenza

IEEE International Reliability Physics Symposium (IRPS)pp.61-1, (2022)

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High speed thermal mapping on six-pack SiC-based module for hybrid and electric vehicles

Giuliana Malta,Laura Anoldo, Bruna Mazza, Giuseppe G. Piccione,Alfio Russo,Michele Calabretta,Sebastiano Russo,Alessandro Sitta,Angelo Messina, Antonio Lionetto,Salvatore Patanè

2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)pp.1-5, (2022)

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High-Resolution Two-Dimensional Imaging Of The 4h-Sic Mosfet Channel By Scanning Capacitance Microscopy