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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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论文共 14 篇作者统计合作学者相似作者

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An Assessment of Sample Preparation Challenges in 3D Stacked Integrated Circuit Devices for Post-Silicon Verification and Validation
Noah Padro,Yash Patel, Jon Scholl,John Kelley,Adam R. Waite, Matt Sale,Adam Kimura
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.152-158, (2023)
引用0浏览0EIWOS引用
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0
Experimental Characterization of Two-Photon Optical Beam Induced Current Imaging for Microelectronics Assurance
Ryan J. Patton,Anthony George,Adam Kimura,Jamin McCue
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.159-163, (2023)
引用0浏览0EIWOS引用
0
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Towards PCB Netlist Extraction from Multimodal Imagery
J. Timothy Balint,Anthony F. George, Chance Carafice, Josh Meleski,Adam Kimura
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.1-7, (2022)
引用1浏览0EIWOS引用
1
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Netlist Decompilation Workflow for Recovered Design Verification, Validation, and Assurance
Katie Liszewski, Tim McDonley, Josh Delozier, Andrew Elliott, Dylan Jones, Matthew Sutter,Adam G. Kimura
IACR Cryptol. ePrint Arch. (2021): 780
引用1浏览0EI引用
1
0
Preparation, Imaging, and Design Extraction of the Front-End-of-Line and Middle-of-Line in a 14 nm Node FinFET Device
Adam R. Waite,Yash Patel,John J. Kelley,Jonathan H. Scholl,Joshua Baur,Adam Kimura, Eric D. Udelhoven,Glen David Via,Richard Ott, Daniel L. Brooks
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.1-6, (2021)
引用5浏览0EIWOS引用
5
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Two-Photon Optical Beam Induced Current for Circuit Level Verification and Validation of a 130 nm Microelectronic Device
Jeffrey Simon, Noah Mun,Anthony George,Josh Baur, James Busch, Christian Meadows, Katie Liszewski, Isabel Boona, Kurtis Wickey,Thomas Kent,Adam Kimura,Jamin McCue,
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.1-7, (2021)
引用1浏览0EIWOS引用
1
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A Decomposition Workflow for Integrated Circuit Verification and Validation
Adam Kimura,Jon Scholl,James Schaffranek, Matthew Sutter, Andrew Elliott, Mike Strizich,Glen David Via
Journal of Hardware and Systems Securityno. 1 (2020): 34-43
引用18浏览0EI引用
18
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Sample Mounting Methods for Precision Delayering of 130 nm Integrated Circuit Devices
Jonathan Scholl,Yash Patel,Joshua Baur,Adam Kimura,Adam Waite,John Kelley,Glen David Via
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)pp.1-5, (2020)
引用2浏览0EIWOS引用
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