基本信息
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Bio
First name / Surname: Adam LŐRINCZI
Address: National Institute of Research and Development for Materials Physics (INCDFM), 405A Atomistilor Str., 077125 Măgurele, IF, Romania
Telephone(s): +40 21 369.01.70 ext. 195; Mobile: +40 726 231.507
E-mail: lorinczi@infim.ro
Work experience
Dates Since 2017 – present
Position held: Scientific Researcher, 2nd degree
Main activities and responsibilities:
1. Preparation of thin fims, thin film multilayers and heterostructures by vacuum thermal evaporation for various chalcogenide alloys and metals;
2. X-ray diffraction (XRD) structural analysis of non-crystalline and polycrystalline materials, mostly of chalcogenide alloys in bulk and thin film form;
3. Preparation and study of ultrathin films and multilayers of fatty acids based materials of various composition by means of Langmuir-Blodgett (LB) deposition technique for sensors applications;
4. Preparation of chalcogenide-glass microlenses (d ~ 50-800 µm) with high refractive index (n~2.4) for optical application;
5. Identifying scientific subjects of current interest in the field, and applying for funding in the group.
Dates Nov. 2004 – May 2005
Position held: Post-doctoral fellowship at Lehigh University of Bethlehem, 27 Memorial Drive West, Bethlehem, PA 18015, USA.
Host: Prof. Dr. Himanshu JAIN
Main activities and responsibilities:
As main scientific interest I had to study and optimize the photolithographic process for MEMS applications, based on the chalcogenide As2S3.
Also here I learned the thin film deposition technique of chalcogenide thin films and thin metallic layers by means of vacuum thermal evaporation.
Some of the results of these studies regarding also modelling of the experimental data on etching processes have been published later in Phil. Mag. Lett. in 2009.
Dates January 2001 - July 2017
Position held: Member of the Local Organizing Committee for the "Amorphous and Nanostructured Chalcogenides" (ANC) International Conference series, organized traditionally in Romania by Prof. Mihai POPESCU (the first was ANC-1 in Bucharest, in 2001, while the latest was ANC-8 in Sinaia);
Dates Oct. 1998 – July 1999
Position held: Post-graduate fellowship for specialization (DAAD Jahresstipendium) at Institut für Physik der Technische Universität Chemnitz, Reichenhainer Straße 70, Neues Physikgebäude (NPhG), Raum P150, 09126 Chemnitz, Germany
Supervisor: Prof. Dr. Hab. Walter HOYER
Main activities and responsibilities:
X-ray diffraction (XRD) and differential scanning calorimetry (DSC) measurements, benefitting of all the available up-to-date scientific facilities.
As a novelty for our group at that time, I managed to separate on the XRD pattern of the amorphous thin films the parasitic contribution of the silicon substrate, which often may partially or completely overlap the useful information contained by the first sharp diffraction peak (FSDP) of the studied amorphous thin films. A paper published in Thin Solid Films (2002) summarizes the results.
Research Interests
Papers共 91 篇Author StatisticsCo-AuthorSimilar Experts
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Molecules (Basel, Switzerland)no. 17 (2020): 3820-3820
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Author Statistics
#Papers: 93
#Citation: 1022
H-Index: 23
G-Index: 27
Sociability: 6
Diversity: 0
Activity: 0
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