基本信息
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Bio
Adrian Chasin received the bachelor’s degree in electrical engineering from the Universidade Federal de Minas Gerais, Belo Horizonte, Brazil, the master’s degree in electronic engineering and from ESIEE-Paris, Paris, France, and the master’s degree in nanotechnology and the Ph.D. degree in electrical engineering from KU Leuven, Leuven, Belgium, in 2014.
His current research interests include oxide semiconductors based thin-film devices for RF applications.
Research Interests
Papers共 154 篇Author StatisticsCo-AuthorSimilar Experts
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2024 IEEE International Reliability Physics Symposium (IRPS)pp.P36.PI-1-P36.PI-7, (2024)
Yusuke Higashi,J. P. Bastos,Adrian Vaisman Chasin,Laurent Breuil,Antonio Arreghini, S. Ramesh,S. Rachidi, Y. Jeong,Geert Van den Bosch,Maarten Rosmeulen
IEEE International Reliability Physics Symposiumpp.1-6, (2024)
2024 IEEE International Reliability Physics Symposium (IRPS) (2024)
2024 IEEE International Reliability Physics Symposium (IRPS) (2024)
Mischa Thesberg, Franz Schanovsky, Ying Zhao, Markus Karner,Jose Maria Gonzalez-Medina, Zlatan Stanojević,Adrian Chasin, Gerhard Rzepa
Micromachinesno. 7 (2024): 829
SOLID-STATE ELECTRONICS (2024): 108866
IEEE International Reliability Physics Symposiumpp.1-6, (2024)
Ying Zhao, Pietro Rinaudo,Adrian Vaisman Chasin,Brecht Truijen,Ben Kaczer,Nouredine Rassoul,Harold Dekkers,Attilio Belmonte,Ingrid De Wolf,Gouri Sankar Kar,Jacopo Franco
IEEE International Reliability Physics Symposiumpp.1-7, (2024)
Barry J. O'Sullivan,AliReza Alian, Arturo Sibaja Hernandez,Jacopo Franco,Sachin Yadav,Hao Yu, A. Rathi,Uthayasankaran Peralagu,Adrian Vaisman Chasin,Bertrand Parvais,Nadine Collaert
IEEE International Reliability Physics Symposiumpp.1-9, (2024)
2024 IEEE International Reliability Physics Symposium (IRPS)pp.1-9, (2024)
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