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个人简介
Alain Bravaix received the degree from the University of Sciences of Paris, Paris, France, and the Ph.D. degree in microelectronics and informatics in 1991, with his dissertation addressing the hot-carrier effects in submicrometer PMOSFETs.
He joined the R&D Research Laboratory of BULL S.A., Les Clayes-sous-Bois, France, in 1988. From 1991 to 1993, he was a Postdoctorate Fellow in the Solid-State Physics Research Group of the Institut d'Electronique et de Microélectronique du Nord (IEMN), Lille, France. Since 1994, he has been developing research activities and teaching towards engineering and master degrees at the Institut Supérieur d'Electronique et du Numérique (ISEN), Toulon, France. Since 2000, he has been a member of Laboratoire Matériaux et Microelectronique de Provence (L2MP UMR 6137), Toulon. His research interests include device and circuit reliability developing electrical characterization techniques for novel and ultrasmall CMOS nodes.
Dr. Bravaix is a member of the IEEE Electron Devices Society and a Reviewer for several journals such as ieee transactions on electron devices, ieee transactions on device and materials reliability, Microelectronics Reliability, and Solid-State Electronics.
研究兴趣
论文共 142 篇作者统计合作学者相似作者
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MICROMACHINESno. 2 (2024): 205
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-8, (2023)
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-6, (2023)
2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-8, (2023)
2023 IEEE International Integrated Reliability Workshop (IIRW) (2023)
A. Bravaix, G Hamparsoumian, J. Sonzogni, H. Pitard, T. Garba-Seybou,Edith Kussener,X. Federspiel,F. Cacho
Journal of physicsno. 1 (2023): 012003-012003
Microelectronics Reliability (2023): 115111
F. Cacho,A. Bravaix,T. Garba Seybou, H. Pitard,X. Federspiel, T. Kumar,F. Giner, A. Michard, D. Celeste, B. Miller, V. Dhanda, A. Varshney,
2022 IEEE International Integrated Reliability Workshop (IIRW)pp.1-7, (2022)
IEEE International Reliability Physics Symposium (IRPS)pp.1-11, (2022)
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