Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector

Boštjan Jenčič,Luka Šepec,Primož Vavpetič,Mitja Kelemen,Zdravko Rupnik,Matjaž Vencelj,Katarina Vogel-Mikuš,Nina Ogrinc Potočnik,Shane R. Ellis,Ron M.A. Heeren,Primož Pelicon

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms（2019）

引用 5|浏览5

暂无评分

摘要

Secondary ion mass spectrometry (SIMS), based on primary ions within the MeV energy domain, also known as MeV-SIMS, is a subject of increasing scientific interest. The main drive for the interest in the development of MeV-SIMS is the ability to desorb high yields of large non-fragmented organic molecular ions from the sample surface. This makes MeV-SIMS particulary useful in imaging of biological tissues.

查看译文

关键词

MeV-SIMS,Stigmatic imaging,Time-of-Flight

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要